FIB 2007

ADVANCES IN FOCUSED

ION BEAM MICROSCOPY

 

Royal Microscopical Society
37/38 St Clements, Oxford, OX4 1AJ, UK
Tel: 01865 248768 Fax: 01865 791237
E-mail: info@rms.org.uk http://www.rms.org.uk
Co-Supported by the EPSRC NanoFIB network : http://www.nanofib.org

FIB 2007
ADVANCES IN FOCUSED ION BEAM MICROSCOPY

Friday 29th June 2007
Materials Science Centre, University of Manchester, U.K.

Focused ion beam (FIB) microscopy is a unique interactive tool for the in-situ, site-specific nanomachining and microstructural analysis of nanostructures. There is dramatic growth in FIB activity in areas such as direct device processing, 3D micromachining, nanopatterning, biological and nanomaterials analysis.

This one-day meeting is aimed at both current and future FIB users, covering the latest exciting FIB developments in the areas of nanoprocessing and nanoanalysis techniques, and state-of-the-art FIB instrumental development. Important topics will be highlighted in keynote presentations.

Note: There will also be two 1 hr hands-on FIB training sessions on the in situ lift-out technique run during the one day meeting.

NanoFIB 2007 speakers will include:

Dr Victor Callegari, EMPA, Switzerland
- Focused ion beam micro- and nanostructuring of photonic crystals

Dr Susan Turnbull, Dept. Physics & Astronomy, The University of Glasgow, UK
- Applications of Dual Beam FIB in Nanomagnetics

Dr Peter Gnauck, Carl Zeiss GmbH, Germany
- High sensitive SIMS on frozen organic samples

Abstracts for short oral and poster contributions (200 words in length) are invited, including in the FIB technology areas of:

" Semiconductor devices and failure analysis
" Novel 3D micromachining applications and tool manufacture
" Nanopatterning and nanocircuits
" Biological applications of FIB
" Specimen preparation methods for nanoanalysis
" Instrumentation development

Abstract deadline: 22nd June 2007
Registration deadline: 22nd June 2007

For flyer click here

For RMS online registration click here

For further details and abstract submission please contact the organisers:
Dr. Richard Langford (Manchester): richard.langford@manchester.ac.uk
Dr. Beverley Inkson (NanoFIB): beverley.inkson@sheffield.ac.uk
The Royal Microscopical Society, 37/38 St Clements, Oxford, OX4 1AJ.
E-mail: info@rms.org.uk Tel: 01865 248768 Fax: 01865 791237 http://www.rms.org.uk

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